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Oxford Inca

 

Oxford Inca

The Oxford Inca X-act and Dry Cool, energy dispersive x-ray microanalysis systems are utilised in the CMA to provide elemental analysis capabilities on the SEM systems.

A scanning electron microscope (SEM) functions by scanning a focused beam of high energy electrons across a sample surface. The beam-specimen interaction produces a number of signals including secondary electrons, back-scattered electrons and X-rays. These X-rays are characteristic of the elements present in the sample matrix and they may be separated out in an energy spectrum to identify the elemental composition of the specimen.

Quantitative analysis maybe accurately carried out using prepared standards. The X-rays can also used to perform line profile or be mapped back to their original position in the sample to provide an x-ray map of the distribution of the elements in the sample.

 

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Contact: nleddy@tcd.ie.
Last updated: Nov 29 2007.